Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6499340 | Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope | Masatoshi Yasutake, Akira Inoue, Akihiko Homma, Ryuichi Matsuzaki, Gerd Binnig | 2002-12-31 |
| 6369400 | Magnetic scanning or positioning system with at least two degrees of freedom | Mark Ian Lutwyche, Peter Vettiger | 2002-04-09 |