Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6490223 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Du-Eung Kim, Choong-Keun Kwak | 2002-12-03 |
| 6487117 | Method for programming NAND-type flash memory device using bulk bias | Jeong-Hyuk Choi | 2002-11-26 |