Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6490223 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Du-Eung Kim, Yun-seung Shin | 2002-12-03 |
| 6456547 | Semiconductor memory device with function of repairing stand-by current failure | Hyun-Sun Mo, Du-Eung Kim | 2002-09-24 |