Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6490223 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Du-Eung Kim, Choong-Keun Kwak, Yun-seung Shin | 2002-12-03 |
| 6463002 | Refresh-type memory with zero write recovery time and no maximum cycle time | Chang-Rae Kim, Jong Yul Park, Min-Chul Chung | 2002-10-08 |