Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445172 | Wafer probing system and method of calibrating wafer probing needle using the same | Ki-Sang Kang, Se-Jang Oh | 2002-09-03 |
SP
Seok-Ho Park
Overall (2002): #120,071 of 266,432Top 50%
1
Patents 2002