Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445172 | Wafer probing system and method of calibrating wafer probing needle using the same | Seok-Ho Park, Ki-Sang Kang | 2002-09-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445172 | Wafer probing system and method of calibrating wafer probing needle using the same | Seok-Ho Park, Ki-Sang Kang | 2002-09-03 |