Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445172 | Wafer probing system and method of calibrating wafer probing needle using the same | Seok-Ho Park, Se-Jang Oh | 2002-09-03 |
KK
Ki-Sang Kang
Overall (2002): #173,582 of 266,432Top 70%
1
Patents 2002