SI

Shigeyuki Iwasa

NE Nec: 4 patents #46 of 1,934Top 3%
📍 Tokyo, MO: #18 of 88 inventorsTop 25%
Overall (2002): #12,256 of 266,432Top 5%
4
Patents 2002

Issued Patents 2002

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
6469197 Negative photoresist composition using polymer having 1,2-diol structure and process for forming pattern using the same Katsumi Maeda, Kaichiro Nakano, Etsuo Hasegawa 2002-10-22
6437052 Monomer having diol structure, polymer thereof, and negative photoresist composition and pattern forming method using the same Katsumi Maeda, Etsuo Hasegawa 2002-08-20
6391529 (Meth)acrylate, polymer photoresist composition, and pattern forming process making use of the composition Katsumi Maeda, Kaichiro Nakano, Etsuo Hasegawa 2002-05-21
6352813 Photosensitive resin composition and patterning method using the same Kaichiro Nakano, Katsumi Maeda, Etsuo Hasegawa 2002-03-05