Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6501267 | Eddy-current flaw detector probe | Masaaki Kurokawa | 2002-12-31 |
| 6370485 | Signal processing apparatus and non-destructive testing apparatus using the same | Kayoko Kawata, Shintaro Kumano | 2002-04-09 |