Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6501267 | Eddy-current flaw detector probe | Mitsuyoshi Matsumoto | 2002-12-31 |
| 6424151 | Method and apparatus for evaluation of eddy current testing signal | Kayoko Kawata, Yoshihiro Asada | 2002-07-23 |
| 6337450 | Method and apparatus for classifying and recovering the main components of used batteries | Tadaaki Tanii, Satoshi Tsuzuki, Shiro Honnmura, Takeo Kamimura, Takahiko Hirai +1 more | 2002-01-08 |