Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6424151 | Method and apparatus for evaluation of eddy current testing signal | Masaaki Kurokawa, Yoshihiro Asada | 2002-07-23 |
| 6370485 | Signal processing apparatus and non-destructive testing apparatus using the same | Shintaro Kumano, Mitsuyoshi Matsumoto | 2002-04-09 |