Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6496958 | Yield prediction and statistical process control using predicted defect related yield loss | Reinhold Ott, Heinrich Ollendorf | 2002-12-17 |
| 6434725 | Method and system for semiconductor testing using yield correlation between global and class parameters | Michael Sommer, Larry Broach | 2002-08-13 |
| 6367040 | System and method for determining yield impact for semiconductor devices | Reinhold Ott, Dieter Rathei | 2002-04-02 |