Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6496958 | Yield prediction and statistical process control using predicted defect related yield loss | Herbert Lammering, Heinrich Ollendorf | 2002-12-17 |
| 6380855 | Apparatus for safeguarding a merchandise item against theft | — | 2002-04-30 |
| 6367040 | System and method for determining yield impact for semiconductor devices | Herbert Lammering, Dieter Rathei | 2002-04-02 |