Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6499120 | Usage of redundancy data for displaying failure bit maps for semiconductor devices | — | 2002-12-24 |
| 6480024 | Circuit configuration for programming a delay in a signal path | Stefan Dietrich, Thomas Hein, Patrick Heyne, Michael Markert, Thilo Marx +4 more | 2002-11-12 |
| 6434503 | Automated creation of specific test programs from complex test programs | — | 2002-08-13 |
| 6434725 | Method and system for semiconductor testing using yield correlation between global and class parameters | Larry Broach, Herbert Lammering | 2002-08-13 |