Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6496023 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more | 2002-12-17 |
| 6479305 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2002-11-12 |
| 6455335 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2002-09-24 |
| 6358762 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2002-03-19 |