Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6455335 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Makoto Kitano, Akihiko Ariga, Yuji Wada, Naoto Ban +7 more | 2002-09-24 |