Issued Patents 2002
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6496023 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake, Hideyuki Aoki +1 more | 2002-12-17 |
| 6479305 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2002-11-12 |
| 6465264 | Method for producing semiconductor device and apparatus usable therein | Ryuji Kohno, Hiroya Shimizu, Atsushi Hosogane, Toshio Miyatake, Hideo Miura +4 more | 2002-10-15 |
| 6444172 | Water quality meter and water quality monitoring system | Masao Fukunaga, Tamio Ishihara, Koji Saito, Katsutoshi Yamada, Hideo Enoki +3 more | 2002-09-03 |
| 6398930 | Water quality meter and water quality monitoring system | Masao Fukunaga, Tamio Ishihara, Koji Saito, Katsutoshi Yamada, Hideo Enoki +3 more | 2002-06-04 |
| 6358762 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Atsushi Hosogane, Hideyuki Aoki +1 more | 2002-03-19 |