Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6492764 | Metal halide lamp | Yoshiharu Nishiura, Takashi Maniwa | 2002-12-10 |
| 6384909 | Defect inspection method and apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Shigeru Matsui, Yoshitaka Kodama, Hitoshi Komuro | 2002-05-07 |
| 6342764 | High pressure discharge lamp | Yoshiharu Nishiura, Takashi Yamamoto, Shiki Nakayama, Hiroshi Nohara | 2002-01-29 |