Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6421308 | State detecting device and optical disk device | Naoki Kizu, Kazuhiro Sugiyama, Noboru Yashima, Yukari Hiratsuka | 2002-07-16 |
| 6384909 | Defect inspection method and apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Yoshitaka Kodama, Hitoshi Komuro, Kazuo Takeda | 2002-05-07 |