Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6463561 | Almost full-scan BIST method and system having higher fault coverage and shorter test application time | Sudipta Bhawmik, Huan-Chih Tsai | 2002-10-08 |
| 6345373 | System and method for testing high speed VLSI devices using slower testers | Srimat Chakradhar, Angela Krstic | 2002-02-05 |