SC

Srimat Chakradhar

NE Nec: 3 patents #1 of 31Top 4%
University of California: 1 patents #176 of 1,057Top 20%
📍 Manalapan, NJ: #2 of 25 inventorsTop 8%
🗺 New Jersey: #425 of 5,778 inventorsTop 8%
Overall (2002): #20,782 of 266,432Top 8%
3
Patents 2002

Issued Patents 2002

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6467058 Segmented compaction with pruning and critical fault elimination Surendra K. Bommu, Kiran B. Doreswamy 2002-10-15
6378096 On-line partitioning for sequential circuit test generation Kiran B. Doreswamy, Surendra K. Bommu, Xijiang Lin 2002-04-23
6345373 System and method for testing high speed VLSI devices using slower testers Angela Krstic, Kwang-Ting Cheng 2002-02-05