Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6463561 | Almost full-scan BIST method and system having higher fault coverage and shorter test application time | Sudipta Bhawmik, Kwang-Ting Cheng | 2002-10-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6463561 | Almost full-scan BIST method and system having higher fault coverage and shorter test application time | Sudipta Bhawmik, Kwang-Ting Cheng | 2002-10-08 |