Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6472233 | MOSFET test structure for capacitance-voltage measurements | Nguyen Duc Bui, Effiong Ibok, John R. Hauser | 2002-10-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6472233 | MOSFET test structure for capacitance-voltage measurements | Nguyen Duc Bui, Effiong Ibok, John R. Hauser | 2002-10-29 |