Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6472233 | MOSFET test structure for capacitance-voltage measurements | Khaled Ahmed, Effiong Ibok, John R. Hauser | 2002-10-29 |
| 6413820 | Method of forming a composite interpoly gate dielectric | — | 2002-07-02 |