Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6408412 | Method and structure for testing embedded analog/mixed-signal cores in system-on-a-chip | — | 2002-06-18 |
| 6404218 | Multiple end of test signal for event based test system | Anthony Le, James Alan Turnquist, Shigeru Sugamori | 2002-06-11 |
| 6377065 | Glitch detection for semiconductor test system | Anthony Le, James Alan Turnquist, Shigeru Sugamori | 2002-04-23 |