Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6404218 | Multiple end of test signal for event based test system | Anthony Le, Rochit Rajsuman, Shigeru Sugamori | 2002-06-11 |
| 6377065 | Glitch detection for semiconductor test system | Anthony Le, Rochit Rajsuman, Shigeru Sugamori | 2002-04-23 |
| 6360343 | Delta time event based test system | — | 2002-03-19 |