Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6404218 | Multiple end of test signal for event based test system | James Alan Turnquist, Rochit Rajsuman, Shigeru Sugamori | 2002-06-11 |
| 6377065 | Glitch detection for semiconductor test system | Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori | 2002-04-23 |