Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5638006 | Method and apparatus for wafer level prediction of thin oxide reliability using differentially sized gate-like antennae | Calvin T. Gabriel | 1997-06-10 |
| 5602056 | Method for forming reliable MOS devices using silicon rich plasma oxide film | Vivek Jain, Dipankar Pramanik, Kuang-Yeh Chang | 1997-02-11 |