JW

Jiun-Yuan Wu

UM United Microelectronics: 3 patents #16 of 140Top 15%
Overall (1997): #14,977 of 185,788Top 9%
3
Patents 1997

Issued Patents 1997

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
5633197 Metallization to improve electromigration resistance by etching concavo-concave opening Water Lur 1997-05-27
5633198 Method of forming wiring with gaps in bend to improve electromigration resistance Water Lur 1997-05-27
5612252 Method of forming metallization to improve electromigration resistance Water Lur 1997-03-18