Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5663967 | Defect isolation using scan-path testing and electron beam probing in multi-level high density asics | Grant Lindberg, Sharad Prasad, Arun Gunda | 1997-09-02 |
| 5638380 | Protecting proprietary asic design information using boundary scan on selective inputs and outputs | — | 1997-06-10 |