Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5663967 | Defect isolation using scan-path testing and electron beam probing in multi-level high density asics | Sharad Prasad, Kaushik De, Arun Gunda | 1997-09-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5663967 | Defect isolation using scan-path testing and electron beam probing in multi-level high density asics | Sharad Prasad, Kaushik De, Arun Gunda | 1997-09-02 |