Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5695556 | Determination of critical film thickness of a compound semiconductor layer, and a method for manufacturing a semiconductor device using the method of determination | Hironori Tsukamoto, Masaharu Nagai, Masao Ikeda | 1997-12-09 |