Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5695556 | Determination of critical film thickness of a compound semiconductor layer, and a method for manufacturing a semiconductor device using the method of determination | Koshi Tamamura, Hironori Tsukamoto, Masao Ikeda | 1997-12-09 |
| 5665977 | Semiconductor light emitting device with defect decomposing and blocking layers | Akira Ishibashi, Satoshi Matsumoto, Satoshi Ito, Shigetaka Tomiya, Kazushi Nakano +1 more | 1997-09-09 |