Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5650614 | Optical scanning system utilizing an atomic force microscope and an optical microscope | Naohiko Fujino | 1997-07-22 |
| 5623205 | Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field | Eisuke Tomita | 1997-04-22 |