Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5644245 | Probe apparatus for inspecting electrical characteristics of a microelectronic element | Akihiro Terada | 1997-07-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5644245 | Probe apparatus for inspecting electrical characteristics of a microelectronic element | Akihiro Terada | 1997-07-01 |