Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5644245 | Probe apparatus for inspecting electrical characteristics of a microelectronic element | Satoshi Saitoh | 1997-07-01 |
| 5639204 | Positioning device for an industrial robot | Ryo Nihei, Kyozi Iwasaki, Hikaru Yamashiro | 1997-06-17 |