Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5652428 | Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere | Tadashi Nishioka | 1997-07-29 |
TY
Takao Yasue
Ryoden Semiconductor System Engineering: 1 patents #6 of 22Top 30%
Overall (1997): #70,394 of 185,788Top 40%
1
Patents 1997