YF

Yuji Fukazawa

KT Kabushiki Kaisha Toshiba: 1 patents #480 of 1,730Top 30%
PC Purex Co.: 1 patents #2 of 4Top 50%
Overall (1997): #54,656 of 185,788Top 30%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5643404 Method for examination of silicon wafer surface defects Hisashi Muraoka 1997-07-01