Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5633828 | Circuitry and methodology to test single bit failures of integrated circuit memory devices | David C. McClure, Frank J. Sigmund, John A. Michlowsky | 1997-05-27 |
| 5608678 | Column redundancy of a multiple block memory architecture | — | 1997-03-04 |