Issued Patents 1997
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5703512 | Method and apparatus for test mode entry during power up | — | 1997-12-30 |
| 5701275 | Pipelined chip enable control circuitry and methodology | — | 1997-12-23 |
| 5691950 | Device and method for isolating bit lines from a data line | — | 1997-11-25 |
| 5666482 | Method and system for bypassing a faulty line of data or its associated tag of a set associative cache memory | — | 1997-09-09 |
| 5657292 | Write pass through circuit | — | 1997-08-12 |
| 5654663 | Circuit for providing a compensated bias voltage | Thomas A. Teel | 1997-08-05 |
| 5644542 | Stress test for memory arrays in integrated circuits | James Brady | 1997-07-01 |
| 5640122 | Circuit for providing a bias voltage compensated for p-channel transistor variations | — | 1997-06-17 |
| 5633828 | Circuitry and methodology to test single bit failures of integrated circuit memory devices | Mark A. Lysinger, Frank J. Sigmund, John A. Michlowsky | 1997-05-27 |
| 5629943 | Integrated circuit memory with double bitline low special test mode control from output enable | — | 1997-05-13 |
| 5629896 | Write controlled address buffer | — | 1997-05-13 |
| 5627793 | Clock generation circuit having compensation for semiconductor manufacturing process variations | — | 1997-05-06 |
| 5627787 | Periphery stress test for synchronous RAMs | — | 1997-05-06 |
| 5625603 | Integrated circuit with unequally-sized, paired memory coupled to odd number of input/output pads | Thomas A. Teel | 1997-04-29 |
| 5619466 | Low-power read circuit and method for controlling a sense amplifier | — | 1997-04-08 |
| 5619462 | Fault detection for entire wafer stress test | — | 1997-04-08 |
| 5619456 | Synchronous output circuit | — | 1997-04-08 |
| 5612918 | Redundancy architecture | — | 1997-03-18 |
| 5610866 | Circuit structure and method for stress testing of bit lines | — | 1997-03-11 |
| 5598122 | Voltage reference circuit having a threshold voltage shift | — | 1997-01-28 |
| 5596297 | Output driver circuitry with limited output high voltage | Thomas A. Teel | 1997-01-21 |
| 5594373 | Output driver circuitry with selective limited output high voltage | — | 1997-01-14 |
| 5592422 | Reduced pin count stress test circuit for integrated memory devices and method therefor | — | 1997-01-07 |