Issued Patents 1997
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5696771 | Method and apparatus for performing partial unscan and near full scan within design for test applications | James Beausang, Robert Walker | 1997-12-09 |
| 5633812 | Fault simulation of testing for board circuit failures | James Allen, Theresa L. Meyer | 1997-05-27 |
| 5612963 | Hybrid pattern self-testing of integrated circuits | Bernd Koenemann, John A. Waicukauski | 1997-03-18 |