Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5617426 | Clocking mechanism for delay, short path and stuck-at testing | William H. McAnney, Mark L. Shulman | 1997-04-01 |
| 5612963 | Hybrid pattern self-testing of integrated circuits | Kenneth D. Wagner, John A. Waicukauski | 1997-03-18 |