Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5641992 | Metal interconnect structure for an integrated circuit with improved electromigration reliability | Pei-Ing Lee, Bernd Vollmer, Bill Klaasen | 1997-06-24 |
DR
Darryl D. Restaino
Siemens Components: 1 patents #2 of 6Top 35%
Overall (1997): #161,762 of 185,788Top 90%
1
Patents 1997