Issued Patents 1997
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5681995 | Ultrasonic flaw detecting apparatus for inspecting multi-layer structure and method thereof | Takehiro Ooura, Kazunori Koga, Norio Awamura | 1997-10-28 |
| 5663502 | Method and apparatus for measuring thickness of layer using acoustic waves | Yoshiaki Nagashima, Kenichi Fujiwara, Masao Sato, Masahiro Koike, Hajime Umehara +1 more | 1997-09-02 |
| 5623109 | Plant monitoring and diagnosing method and system, as well as plant equipped with the system | Shunsuke Uchida, Haruo Fujimori, Takaharu Fukuzaki, Izumi Yamada | 1997-04-22 |