LS

Leslie George Stanton

MM Memc Electronic Materials: 1 patents #8 of 25Top 35%
📍 Defiance, MO: #1 of 1 inventorsTop 100%
🗺 Missouri: #293 of 1,153 inventorsTop 30%
Overall (1997): #113,693 of 185,788Top 65%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5592295 Apparatus and method for semiconductor wafer edge inspection Kenneth Krause 1997-01-07