Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5663653 | Wafer probe station for low-current measurements | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 1997-09-02 |
| 5604444 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 1997-02-18 |