Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5657240 | Testing and removal of redundancies in VLSI circuits with non-boolean primitives | Srimat Chakradhar, Steven G. Rothweiler | 1997-08-12 |
| 5606567 | Delay testing of high-performance digital components by a slow-speed tester | Tapan Jyoti Chakraborty | 1997-02-25 |