Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5655110 | Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers | Zoran Krivokapic, William D. Heavlin | 1997-08-05 |
| 5646870 | Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers | Zoran Krivokapic, William D. Heavlin | 1997-07-08 |