TO

Toshimi Ohsawa

AD Advantest: 4 patents #1 of 62Top 2%
📍 Gyōda, JP: #3 of 43 inventorsTop 7%
Overall (1997): #5,450 of 185,788Top 3%
4
Patents 1997

Issued Patents 1997

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
5682393 Pattern generator for cycle delay 1997-10-28
5673271 High speed pattern generator 1997-09-30
5646948 Apparatus for concurrently testing a plurality of semiconductor memories in parallel Shinichi Kobayashi, Tadashi Okazaki, Kazumi Kita, Junichi Kanai, Tadahiko Baba 1997-07-08
5644578 Failure memory device 1997-07-01