Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5646948 | Apparatus for concurrently testing a plurality of semiconductor memories in parallel | Shinichi Kobayashi, Toshimi Ohsawa, Tadashi Okazaki, Junichi Kanai, Tadahiko Baba | 1997-07-08 |